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Microstructural and surface property variations due to the amorphous region formed by thermal annealing in Al-doped ZnO thin films grown on n-Si (100) substrates Han, J. H.; No, Y. S.; Kim, T. W.; Lee, JeongYong; Kim, J. Y.; Choi, W. K., APPLIED SURFACE SCIENCE, v.256, no.6, pp.1920 - 1924, 2010-01 |
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