Showing results 5 to 8 of 8
Electrically inactive nitrogen complex in Si oxynitride Lee, EC; Chang, Kee-Joo, PHYSICAL REVIEW B, v.66, pp.233205 - 233205, 2002-12 |
ESTIMATION OF EFFECTIVE DIFFUSION TIME IN A RAPID THERMAL-DIFFUSION USING A SOLID DIFFUSION SOURCE Cho, Byung Jin; PARK, SK; Kim, Choong Ki, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.39, no.1, pp.111 - 117, 1992-01 |
First-principles study of the atomic structure of B-related defects in crystalline Si predoped with phosphorus Moon, CY; Kim, YS; Chang, Kee-Joo, PHYSICA B-CONDENSED MATTER, v.340, pp.561 - 564, 2003-12 |
Suppression of nitridation-induced interface traps and hole mobility degradation by nitrogen plasma nitridation Ang, CH; Tan, SS; Lek, CM; Lin, W; Zheng, ZJ; Chen, T; Cho, Byung Jin, ELECTROCHEMICAL AND SOLID STATE LETTERS, v.5, no.4, pp.26 - 28, 2002-04 |
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