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Engineering a Subnanometer Interface Tailoring Layer for Precise Hydrogen Incorporation and Defect Passivation for High-End Oxide Thin-Film Transistors Ko, Jong Beom; Cho, Seong-In; Park, Sang-Hee Ko, ACS APPLIED MATERIALS & INTERFACES, v.15, no.40, pp.47799 - 47809, 2023-09 |
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