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Analysis of phase measurement errors in electro-optic holography Baik, SH; Park, SK; Kim, CJ; Kim, Soo Yong, OPTICAL REVIEW, v.8, no.1, pp.26 - 31, 2001 |
Investigation of shear distance in Michelson interferometer-based shearography for mechanical characterization Lee, Jung-Ryul; Yoon, Dong-Jin; Kim, Jung-Seok; Vautrin, Alain, MEASUREMENT SCIENCE & TECHNOLOGY, v.19, no.11, 2008-11 |
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