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Showing results 195941 to 195960 of 276512

195941
THE EFFECT OF SAMPLING INTERVAL ON MOTION ESTIMATION

LEE, JH; Kim, Seong-Dae, IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES, v.E76A, no.4, pp.653 - 656, 1993-04

195942
The effect of Schiff base network on the separation performance of thin film nanocomposite forward osmosis membranes

Akther, Nawshad; Lim, Sungil; Tran, Van Huy; Phuntsho, Sherub; Yang, Yanqin; Bae, Tae-Hyun; Ghaffour, Noreddine; et al, SEPARATION AND PURIFICATION TECHNOLOGY, v.217, pp.284 - 293, 2019-06

195943
The Effect of Schmid Factor in Polycrystalline Aluminum on Slip Band Formation under Fatigue Stress

hur, s.k.; maeng, s.j.; Chun , Soung Soon; Nam, Soo Woo, 대한금속학회지, v.15, no.5, pp.477 - 483, 1977

195944
The effect of Schottky barrier modulation on conduction and failure mechanisms of an Ag/WOx/p-Si based memristor

Park, Taehoon; Jeong, Hakcheon; Park, See-On; Hong, Seok Man; Seo, Seokho; Park, Seungwoo; Choi, Shinhyun, JOURNAL OF APPLIED PHYSICS, v.133, no.7, 2023-02

195945
The effect of SEC reviewers' local knowledge on comment letters = 미국증권거래위원회 검토위원의 지역적 지식이 의견서한에 미치는 영향에 관한 연구link

Cho, Joong Hi; Lee, Kwang June; et al, 한국과학기술원, 2020

195946
The Effect of Second Component Gases on the Transport Properties of Silicon Nitriding Atmosphere

H. Kim; Kim, Chong Hee, JOURNAL OF MATERIALS SCIENCE LETTERS, v.3, pp.199 - 200, 1984

195947
The effect of selective attention on multiple ASSRs for future BCI application

Kaongoen, Netiwit; Jo, Sung-Ho, 5th International Winter Conference on Brain-Computer Interface (BCI), pp.9 - 12, IEEE brain, 2017-01-09

195948
The effect of self-concept clarity on discretionary spending tendency

Sarial-Abi, Gulen; Gurhan-Canli, Zeynep; Kumkale, Tarcan; Yoon, Yeosun, INTERNATIONAL JOURNAL OF RESEARCH IN MARKETING, v.33, no.3, pp.612 - 623, 2016-09

195949
The effect of service workers' proactive personality on their psychological withdrawal behaviors: a moderating effect of servant leadership

Song, Chanhoo; Lee, Chul Ho, LEADERSHIP & ORGANIZATION DEVELOPMENT JOURNAL, v.41, no.5, pp.653 - 667, 2020-07

195950
The effect of shear on turbulence structures in MAST

Fox, Michael; Dunai, Daniel; Field, Anthony; Ghim, Young-chul; Highcock, Edmund; Schekochihin, Alex; Van Wyk, Ferdinand; et al, 17th International Spherical Torus Workshop, York Plasma Institute, 2013-09-16

195951
The effect of shear stress in arteriovenous malformation

Choung, Jin Seung; Ko, Ung Hyun; Park, Eun Young; Choi, Dong Heon; Oh, Eun Jung; Chung, Ho Yun; Shin, Jennifer Hyunjong, IBEC 2016 추계학술대회, 대한의용생체공학회, 2016-11

195952
The effect of shear stress in arteriovenous malformation

Choung, Jin Seung; Ko, Ung Hyun; Park, Eun Young; Choi, Dong Heon; Oh, Eun Jung; Chung, Ho Yun; Shin, Jennifer Hyunjong, 대한생체역학회 2016 추계학술대회, 대한생체역학회, 2016-09-23

195953
The effect of shrink fitting ratios on tool life in bolt forming processes

Lee, Hyun Chul; Saroosh, MA; Song, JH; Im, Yong-Taek, JOURNAL OF MATERIALS PROCESSING TECHNOLOGY, v.209, no.8, pp.3766 - 3775, 2009-04

195954
The Effect of Si Addition on the Stress Corrosion Cracking of Type 304 Austenitic Stainless Steel

y.-d. hahn; s.-i. pyun, 대한금속학회지, v.19, no.6, pp.493 - 499, 1981

195955
The effect of Si impurities on the effective work function at TiN/t-HfO2 interface

Kim, Geun Myeong; Oh, Young Jun; Chang, Kee Joo, 제12회 고등과학원 전자구조 계산학회, KIAS, 2016-06

195956
The effect of Si impurities on the effective work function at TiN/tetragonal-HfO2 interface

Kim, Geun Myeong; Oh, Young Jun; Chang, Kee Joo, APS March Meeting 2016, American Physics Society, 2016-03

195957
The effect of Si impurities on the Schottky barrier height and effective work function at TiN/t-HfO2 interface

김근명; 오영준; 장기주, 한국물리학회 가을 학술논문발표회, 한국물리학회, 2015-10

195958
The effect of Si impurities on the Schottky barrier height at TiN/tetragonal-HfO2 interface

Kim, Geun Myeong; Oh, Young Jun; Chang, Kee Joo, The 18th Asian Workshop on First-Principles Electronic Structure Calculations, ISSP, 2015-11

195959
THE EFFECT OF SI-RICH LAYER COATING ON U-MO VS. AL INTERDIFFUSION

Ryu, Ho Jin; Park, Jae Soon; Park, Jong Man; Kim, Chang Kyu, NUCLEAR ENGINEERING AND TECHNOLOGY, v.43, no.2, pp.159 - 166, 2011-04

195960
The Effect of Si-SiO2 Interface on the Excess Point Defect Distribution in Silicon

Kim, Choong Ki, Symposium on Semiconductor Processing,ASTM/SEMI Meeting, pp.283 - 293, 1984

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