Interfacial Reactions and Joint Strengths of Sn-xZn Solders with Immersion Ag UBM

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The solder joint microstructures of immersion Ag with Sn-xZn (x = 0 wt.%, 1 wt.%, 5 wt.%, and 9 wt.%) solders were analyzed and correlated with their drop impact reliability. Addition of 1 wt.% Zn to Sn did not change the interface microstructure and was only marginally effective. In comparison, the addition of 5 wt.% or 9 wt.% Zn formed layers of AgZn(3)/Ag(5)Zn(8) at the solder joint interface, which increased drop reliability significantly. Under extensive aging, Ag-Zn intermetallic compounds (IMCs) transformed into Cu(5)Zn(8) and Ag(3)Sn, and the drop impact resistance at the solder joints deteriorated up to a point. The beneficial role of Zn on immersion Ag pads was ascribed to the formation of Ag-Zn IMC layers, which were fairly resistant to the drop impact, and to the suppression of the brittle Cu(6)Sn(5) phase at the joint interface.
Publisher
SPRINGER
Issue Date
2010-10
Language
English
Article Type
Article
Keywords

SURFACE FINISH; ZN; CU; RELIABILITY; ALLOYS; INTERMETALLICS; METALLIZATION; PACKAGES; SILVER; PADS

Citation

JOURNAL OF ELECTRONIC MATERIALS, v.39, no.10, pp.2286 - 2291

ISSN
0361-5235
DOI
10.1007/s11664-010-1308-z
URI
http://hdl.handle.net/10203/95277
Appears in Collection
MS-Journal Papers(저널논문)
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