Effect of the target power density on the synthesis and physical properties of sputtered nc-C films

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dc.contributor.authorMyung, HSko
dc.contributor.authorPark, YSko
dc.contributor.authorHong, Bko
dc.contributor.authorHan, JGko
dc.contributor.authorKim, YHko
dc.contributor.authorLee, JeongYongko
dc.contributor.authorShaginyan, LRko
dc.date.accessioned2013-03-06T10:35:41Z-
dc.date.available2013-03-06T10:35:41Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2006-01-
dc.identifier.citationTHIN SOLID FILMS, v.494, pp.123 - 127-
dc.identifier.issn0040-6090-
dc.identifier.urihttp://hdl.handle.net/10203/86707-
dc.description.abstractHydrogen-free nanostructured carbon (nc-C) films were synthesized at various graphite target power densities using a closed field unbalanced magnetron sputtering system (CFUBM). The power density of each graphite target was varied from 10 to 30 W/cm(2) in Ar gas atmosphere with a fixed pressure of 0.4 Pa and a substrate bias voltage of -200 V. The aim of this study was to determine the relationship between the microstructure and physical properties of ne-C films as a function of the target power density. The film structures were examined by Raman spectroscopy, X-ray photoelectron spectroscopy and field emission scanning electron microscopy. The physical properties of the nc-C films were evaluated using a nano-indentation tester, a 4-point probe and a residual stress tester. The number of graphitic nano-cluster increased with increasing target power density and a good conductive nanostructured carbon film was obtained. The nc-C film deposited at a target power density of 30 W/cm(2) exhibited the minimum electrical resistivity. (c) 2005 Elsevier B.V. All rights reserved.-
dc.languageEnglish-
dc.publisherELSEVIER SCIENCE SA-
dc.subjectDIAMOND-LIKE CARBON-
dc.subjectA-C-
dc.subjectH FILMS-
dc.subjectPRESSURE-
dc.titleEffect of the target power density on the synthesis and physical properties of sputtered nc-C films-
dc.typeArticle-
dc.identifier.wosid000233785600024-
dc.identifier.scopusid2-s2.0-27944447311-
dc.type.rimsART-
dc.citation.volume494-
dc.citation.beginningpage123-
dc.citation.endingpage127-
dc.citation.publicationnameTHIN SOLID FILMS-
dc.identifier.doi10.1016/j.tsf.2005.07.170-
dc.contributor.localauthorLee, JeongYong-
dc.contributor.nonIdAuthorMyung, HS-
dc.contributor.nonIdAuthorPark, YS-
dc.contributor.nonIdAuthorHong, B-
dc.contributor.nonIdAuthorHan, JG-
dc.contributor.nonIdAuthorKim, YH-
dc.contributor.nonIdAuthorShaginyan, LR-
dc.type.journalArticleArticle; Proceedings Paper-
dc.subject.keywordAuthornanostructured carbon-
dc.subject.keywordAuthornc-C-
dc.subject.keywordAuthorsp(2) bonding-
dc.subject.keywordAuthorCFUBM-
dc.subject.keywordPlusDIAMOND-LIKE CARBON-
dc.subject.keywordPlusA-C-
dc.subject.keywordPlusH FILMS-
dc.subject.keywordPlusPRESSURE-
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