Origin of transient Vth shift after erase and its impact on 2D/3D structure charge trap Flash memory cell operations
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Park, Jong Kyung | ko |
| dc.contributor.author | Moon, Dong-Il | ko |
| dc.contributor.author | Choi, Yang-Kyu | ko |
| dc.contributor.author | Lee, Seok-Hee | ko |
| dc.contributor.author | Lee, Ki-Hong | ko |
| dc.contributor.author | Pyi, Seung Ho | ko |
| dc.contributor.author | Cho, Byung Jin | ko |
| dc.date.accessioned | 2013-02-25T08:26:16Z | - |
| dc.date.available | 2013-02-25T08:26:16Z | - |
| dc.date.created | 2012-12-03 | - |
| dc.date.created | 2012-12-03 | - |
| dc.date.created | 2012-12-03 | - |
| dc.date.issued | 2012-12-10 | - |
| dc.identifier.citation | IEEE International Electron Devices Meeting | - |
| dc.identifier.uri | http://hdl.handle.net/10203/60471 | - |
| dc.language | English | - |
| dc.publisher | IEEE | - |
| dc.title | Origin of transient Vth shift after erase and its impact on 2D/3D structure charge trap Flash memory cell operations | - |
| dc.type | Conference | - |
| dc.identifier.wosid | 000320615600007 | - |
| dc.identifier.scopusid | 2-s2.0-84876131194 | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | IEEE International Electron Devices Meeting | - |
| dc.identifier.conferencecountry | US | - |
| dc.identifier.conferencelocation | San Francisco, USA | - |
| dc.contributor.localauthor | Choi, Yang-Kyu | - |
| dc.contributor.localauthor | Lee, Seok-Hee | - |
| dc.contributor.localauthor | Cho, Byung Jin | - |
| dc.contributor.nonIdAuthor | Park, Jong Kyung | - |
| dc.contributor.nonIdAuthor | Moon, Dong-Il | - |
| dc.contributor.nonIdAuthor | Lee, Ki-Hong | - |
| dc.contributor.nonIdAuthor | Pyi, Seung Ho | - |
- Appears in Collection
- EE-Conference Papers(학술회의논문)
- Files in This Item
- There are no files associated with this item.
This item is cited by other documents in WoS
| ⊙ Detail Information in WoSⓡ | Click to see |  |
| ⊙ Cited 3 items in WoS | Click to see citing articles in |  |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.