CONTACTLESS CONDUCTIVITY DETECTION; DOUBLE-LAYER CAPACITANCE; ROUGH METAL-SURFACE; CAPILLARY-ELECTROPHORESIS; ANALYSIS SYSTEMS; ELECTRODES; DEVICES; OPTIMIZATION; GLASS; SEPARATIONS
LAB ON A CHIP, v.5, no.3, pp.270 - 279
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.