DSpace at KOASAS: Analysis of Interface Trap States Generated by the Self-Heating Effect in Highly Flexible Single-Crystalline Si Nanomembrane Transistors

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College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Conference Papers(학술회의논문)

Analysis of Interface Trap States Generated by the Self-Heating Effect in Highly Flexible Single-Crystalline Si Nanomembrane Transistors

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Bong, Jae Hoon / KIM, SEUNGYOON / Jeong, Chan Bae / Chang, Ki Soo / Hwang, Wan Sik / Cho, Byung-Jin researcher

Publisher: IEEE

Issue Date: 2017-12-06

Language: English

Citation: 48th IEEE Semiconductor Interface Specialists Conference

URI: http://hdl.handle.net/10203/240432

Appears in Collection: EE-Conference Papers(학술회의논문)

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Analysis of Interface Trap States Generated by the Self-Heating Effect in Highly Flexible Single-Crystalline Si Nanomembrane Transistors

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