DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, Kwyro | - |
dc.contributor.author | Han, Chul-Hi | - |
dc.contributor.author | Kim, Shi-Ho | - |
dc.contributor.author | Lee, Ho-Jun | - |
dc.contributor.author | Choi, Sang-Soo | - |
dc.contributor.author | Jeon, Young-Jin | - |
dc.contributor.author | Fabrizio, Enzo Di | - |
dc.contributor.author | Gentili, Massimo | - |
dc.date.accessioned | 2013-03-14T06:05:36Z | - |
dc.date.available | 2013-03-14T06:05:36Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1993 | - |
dc.identifier.citation | Technical Digest of 3rd International Conference on VLSI and CAD, v., no., pp.20 - 23 | - |
dc.identifier.uri | http://hdl.handle.net/10203/105964 | - |
dc.language | ENG | - |
dc.title | X-ray irradiation induced damage in MOS structures and it's effect on oxide reliability | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 20 | - |
dc.citation.endingpage | 23 | - |
dc.citation.publicationname | Technical Digest of 3rd International Conference on VLSI and CAD | - |
dc.identifier.conferencecountry | South Korea | - |
dc.identifier.conferencecountry | South Korea | - |
dc.contributor.localauthor | Lee, Kwyro | - |
dc.contributor.localauthor | Han, Chul-Hi | - |
dc.contributor.nonIdAuthor | Kim, Shi-Ho | - |
dc.contributor.nonIdAuthor | Lee, Ho-Jun | - |
dc.contributor.nonIdAuthor | Choi, Sang-Soo | - |
dc.contributor.nonIdAuthor | Jeon, Young-Jin | - |
dc.contributor.nonIdAuthor | Fabrizio, Enzo Di | - |
dc.contributor.nonIdAuthor | Gentili, Massimo | - |
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