E-PLOT : A New Method Characterizing the Substrate Current and the Saturation Voltage of Fresh and Hot-Electron Stressed nMOSFET
- Publisher
- 대한전자공학회
- Issue Date
- 1994
- Language
- KOR
- Citation
대한전자공학회 학술대회 , pp.119 - 120
- Appears in Collection
- EE-Conference Papers(학술회의논문)
- Files in This Item
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.