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Showing results 1 to 2 of 2

1
Determination of film thickness and surface profile using reflectometry and spectrally resolved phase shifting interferometry

You, Joonho; Debnath, Sanjit Kumar; Kim, Seung-Woo, INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, v.10, no.5, pp.5 - 10, 2009-12

2
Diffusion Study by IR Micro-Imaging of Molecular Uptake and Release on Mesoporous Zeolites of Structure Type CHA and LTA

Bonilla, Mauricio Rincon; Titze, Tobias; Schmidt, Franz; Mehlhorn, Dirk; Chmelik, Christian; Valiullin, Rustem; Bhatia, Suresh K.; et al, MATERIALS, v.6, no.7, pp.2662 - 2688, 2013-07

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