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Showing results 1 to 11 of 11

1
Characteristic of sputtered La$_{0.5}$Sr$_{0.5}CoO_3$ oxide electrode thin film for FRAM and ferroelectric ceramics = 스퍼터링 방법으로 증착된 FRAM용 산화물 전극 La$_{0.5}$Sr$_{0.5}CoO_3$ 박막 및 강유전 세라믹스의 특성 연구link

Kim, Jai-Hyun; 김재현; et al, 한국과학기술원, 2004

2
Effects of pulsed plasma on low temperature growth of Pb-based ferroelectric films in direct liquid injection metalorganic chemical vapor deposition

Byun, Kyung-Mun; Lee, Won-Jong, CURRENT APPLIED PHYSICS, v.7, no.2, pp.113 - 117, 2007-02

3
Fluorescence Recovery after Merging a Droplet to Measure the Two-dimensional Diffusion of a Phospholipid Monolayer

Jeong, Dae-Woong; Kim, KyuHan; Choi, Myung-Chul; Choi, Siyoung Q., JOVE-JOURNAL OF VISUALIZED EXPERIMENTS, no.104, 2015-10

4
FRAM 소자 응용을 위한 ECR PECVD PZT 커패시터 특성에 미치는 전극의 영향 = Effect of electrodes on the characteristics of ECR PECVD PZT capacitors for the application to FRAM deviceslink

이희철; Lee, Hee-Chul; et al, 한국과학기술원, 2002

5
Gd-substituted bismuth titanate film capacitors having ferroelectric reliability and large non-volatile charges

Chon, U; Jang, HM; Shin, NS; Kim, JS; Ahn, DC; Kim, YS; No, Kwangsoo, PHYSICA B-CONDENSED MATTER, v.388, pp.190 - 194, 2007-01

6
Imprint characteristics of Pt/Pb(ZrTi)O-3/Ir capacitors

Lee K.W.; Lee, Won-Jong, METALS AND MATERIALS INTERNATIONAL, v.12, no.1, pp.85 - 93, 2006-02

7
Improved Oxygen Diffusion Barrier Properties of Ruthenium-Titanium Nitride Thin Films Prepared by Plasma-Enhanced Atomic Layer Deposition

Jeong, Seong-Jun; Kim, Doo-In; Kim, Sang Ouk; Han, Tae Hee; Kwon, Jung-Dae; Park, Jin-Seong; Kwon, Se-Hun, JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.11, no.1, pp.671 - 674, 2011-01

8
Preparation and characterization of Pb(Zr,Ti)O-3 films deposited on Pt/RuO2 hybrid electrode for ferroelectric random access memory devices

Lee, HC; Lee, Won-Jong, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.40, no.11, pp.6566 - 6573, 2001-11

9
Quantitative representation of the functional resonance analysis method for risk assessment

Kim, Yoo Chan; Yoon, Wan Chul, RELIABILITY ENGINEERING & SYSTEM SAFETY, v.214, 2021-10

10
Thermochemical stability of IrO2 bottom electrodes in direct-liquid-injection metalorganic chemical vapor deposition of Pb(Zr,Ti)O-3 films

Byun, KM; Lee, Won-Jong, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, v.43, no.5A, pp.2655 - 2660, 2004-05

11
고집적 DRO FRAM 소자용 PZT 박막 캐패시터의 신뢰성 연구 = Reliability study in PZT thin film capacitors for high-density DRO FRAM deviceslink

이강운; Lee, Kang-Woon; et al, 한국과학기술원, 2003

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