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Atomically Thin Ohmic Edge Contacts Between Two-Dimensional Materials Guimaraes, Marcos H. D.; Gao, Hui; Han, Yimo; Kang, Kibum; Xie, Saien; Kim, Cheol-Joo; Muller, David A.; et al, ACS NANO, v.10, no.6, pp.6392 - 6399, 2016-06 |
Quantitative analysis of charge trapping and classification of sub-gap states in MoS2 TFT by pulse I-V method Park, Junghak; Hur, Ji-Hyun; Jeon, Sanghun, NANOTECHNOLOGY, v.29, no.17, 2018-04 |
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