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Results 1-10 of 231 (Search time: 0.01 seconds).

NO Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
1
Development of a Framework for Analyzing Process Monitoring Data with Applications to Semiconductor Manufacturing process

Yoon, YH; Kim, YS; Kim, SJ; Yum, Bong-Jinresearcher, COMPSTAT2002, pp.297 - 302, 2002-08

2
Development and comparisons of reliability acceptance sampling plans for the weibull distribution under accelerated type-i censoring = 가속 정시중단 하에서 와이블 분포에 대한 신뢰도 합격 판정 샘플링 검사계획의 개발 및 비교연구link

Kim, Min; 김민; Yum, Bong-Jinresearcher; 염봉진, 한국과학기술원, 2008

3
다특성치에 대한 파라미터설계 방법의 비교에 관한 연구 = A comparative study of parameter design methods for multiple performance characteristicslink

소우진; Soh, Woo-Jin; 염봉진researcher; Yum, Bong-Jin, 한국과학기술원, 2011

4
다특성치에 대한 파라미터설계 방법의 비교에 관한 연구 = A comparative study of parameter design methods for multiple performance characteristicslink

소우진; Soh, Woo-Jin; 염봉진researcher; Yum, Bong-Jin, 한국과학기술원, 2011

5
Parameter design in the case of multiple performance characteristics = 다성능특성치에 대한 파라미터 설계link

Lee, Pal-Hun; 이팔훈; Yum, Bong-Jinresearcher; 염봉진, 한국과학기술원, 2001

6
밀도기반 클러스터링을 이용한 반도체 공정의 결함 패턴 분석 알고리즘 개발 = Development of an algorithm for defect pattern analysis in semiconductor manufacturing using density-based clusteringlink

구재훈; Koo, Jae-Hoon; 염봉진researcher; Yum, Bong-Jin, 한국과학기술원, 2012

7
Planning performance degradation tests - A review

Yum, Bong-Jinresearcher; Lim, H; Seo, SK, INTERNATIONAL JOURNAL OF INDUSTRIAL ENGINEERING-THEORY APPLICATIONS AND PRACTICE, v.14, pp.372 - 381, 2007-12

8
Development of a recommender system based on navigational and behavioral patterns of customers in e-commerce sites

Kim, YS; Yum, Bong-Jinresearcher; Song, J; Kim, SM, EXPERT SYSTEMS WITH APPLICATIONS, v.28, pp.381 - 393, 2005-02

9
채널의 출력제어를 통한 셀룰라 이동통신 시스템의 최적 설계 = Optimal design of mobile cellular communication systems by channel power controllink

옥창수; Ok, Chang-Soo; 염봉진researcher; Yum, Bong-Jin, 한국과학기술원, 1994

10
A hybrid model of partial least squares and artificial neural network for analyzing process monitoring data

Kim, YS; Yum, Bong-Jinresearcher; Kim, M, International Joint Conference on Neural Networks (IJCNN'01), v.3, pp.2292 - 2297, 2001-07-15

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