Reproducible resistance switching for BaTiO3 thin films fabricated by RF-magnetron sputtering

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BaTiO3 (BTO) thin film was fabricated to investigate its non-volatile and reversible resistance switching phenomena by RF-sputtering method. The reversible resistance switching phenomenon was observed by DC voltage sweep and Pt/BTO/Pt metal-insulator-metal structure devices showed the bipolar resistance switching such as Pr0.7Ca0.3MnO3 and Cr-doped SrTiO3. The typical leakage current-voltage characteristic measurements were performed. High resistance state (HRS) and low resistance state (LRS) were maintained without power supply. The margin of the resistance between HRS and LRS is considerable during 120th cycles. The current emission mechanisms were suggested by double logarithm plot of leakage current vs. voltage. The comparison of the spreading current mapping images for two different resistance states showed that local conduction path was formed at LRS and was destroyed at HRS. (C) 2010 Elsevier B.V. All rights reserved.
Publisher
ELSEVIER SCIENCE SA
Issue Date
2011-03
Language
English
Article Type
Article
Keywords

DOPED SRTIO3; MEMORY; TRANSITION; INTERFACE; OXIDES

Citation

THIN SOLID FILMS, v.519, no.10, pp.3291 - 3294

ISSN
0040-6090
DOI
10.1016/j.tsf.2010.12.149
URI
http://hdl.handle.net/10203/97090
Appears in Collection
CBE-Journal Papers(저널논문)MS-Journal Papers(저널논문)
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