DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, Seungwoo | ko |
dc.contributor.author | Gweon, Dae-Gab | ko |
dc.date.accessioned | 2013-03-08T05:18:50Z | - |
dc.date.available | 2013-03-08T05:18:50Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2008-10 | - |
dc.identifier.citation | MEASUREMENT SCIENCE & TECHNOLOGY, v.19, no.10 | - |
dc.identifier.issn | 0957-0233 | - |
dc.identifier.uri | http://hdl.handle.net/10203/92227 | - |
dc.description.abstract | A technique for improving the axial resolution of confocal microscopy is proposed and demonstrated. Based on the interference between two diffraction-limited spots separated along the optical axis, a field domain confined by the heterodyne interference is generated. The effective region of illumination made by the interference makes the point-spread function (PSF) of the confocal microscope sharper. The three-dimensional imaging equations for both coherent and incoherent systems are derived. Numerical simulation and experiment show that the full-width-at-half-maximum (FWHM) of the PSF can be improved by a factor of 1.78 and 1.41, respectively. | - |
dc.language | English | - |
dc.publisher | IOP PUBLISHING LTD | - |
dc.subject | 3D WIDEFIELD MICROSCOPY | - |
dc.subject | POINT-SPREAD FUNCTION | - |
dc.subject | 2 OBJECTIVE LENSES | - |
dc.subject | FLUORESCENCE MICROSCOPY | - |
dc.subject | 2-PHOTON EXCITATION | - |
dc.subject | SCANNING MICROSCOPE | - |
dc.subject | LIGHT-MICROSCOPY | - |
dc.subject | SUPERRESOLUTION | - |
dc.subject | RESTORATION | - |
dc.subject | FILTERS | - |
dc.title | Improvement of the axial resolution in confocal microscopy by the use of heterodyne interference | - |
dc.type | Article | - |
dc.identifier.wosid | 000259113400018 | - |
dc.identifier.scopusid | 2-s2.0-58149314320 | - |
dc.type.rims | ART | - |
dc.citation.volume | 19 | - |
dc.citation.issue | 10 | - |
dc.citation.publicationname | MEASUREMENT SCIENCE & TECHNOLOGY | - |
dc.identifier.doi | 10.1088/0957-0233/19/10/105502 | - |
dc.contributor.localauthor | Gweon, Dae-Gab | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordAuthor | confocal microscopy | - |
dc.subject.keywordAuthor | heterodyne interference | - |
dc.subject.keywordAuthor | axial resolution | - |
dc.subject.keywordAuthor | deconvolution | - |
dc.subject.keywordPlus | 3D WIDEFIELD MICROSCOPY | - |
dc.subject.keywordPlus | POINT-SPREAD FUNCTION | - |
dc.subject.keywordPlus | 2 OBJECTIVE LENSES | - |
dc.subject.keywordPlus | FLUORESCENCE MICROSCOPY | - |
dc.subject.keywordPlus | 2-PHOTON EXCITATION | - |
dc.subject.keywordPlus | SCANNING MICROSCOPE | - |
dc.subject.keywordPlus | LIGHT-MICROSCOPY | - |
dc.subject.keywordPlus | SUPERRESOLUTION | - |
dc.subject.keywordPlus | RESTORATION | - |
dc.subject.keywordPlus | FILTERS | - |
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