Browse "School of Computing(전산학부)" by Title
Showing results 10301 to 10320 of 15971
| Term Recognition Using Technical Dictionary Hierarchy Oh, JH; Lee, K; Choi, Key-Sun, Annual Meeting of the Association for Computational Linguistics (ACL-2000), pp.496 - 503, ACL, 2000-10 |
TermBall: Tracking and Predicting Evolution Types of Research Topics by Using Knowledge Structures in Scholarly Big Data Balili, Christine; Lee, Uichin; Segev, Aviv; Kim, Jaejeung; Ko, Minsam, IEEE ACCESS, v.8, pp.108514 - 108529, 2020-06 |
| Terminological paraphrase extraction from scientific literature based on predicate argument tuples Choi, Sung-Pil; Myaeng, Sung-Hyon, JOURNAL OF INFORMATION SCIENCE, v.38, no.6, pp.593 - 611, 2012-12 |
| Terminology in Korea: KORTERM Choi, Key-Sun; Chae, YS, International Conference on Language Resources and Evaluation (LREC2000), pp.845 - 848, 2000 |
| Terminology, Interactive Media and Standards: A Scenario toward Personalized Interactive Knowledge Services Choi, Key-Sun, the 5th East Asia Forum of Terminology, pp.0 - 0, 2002-11-01 |
| Ternary Cache: Three-valued MLC STT-RAM Caches Hong, Seokin; Lee, Jongmin; Kim, Soontae, IEEE International Conference on Computer Design, IEEE Circuits and Systems Society, 2014-10-20 |
| Test case generation from UML-based specification = UML 명세로부터의 시험사례 생성에 관한 연구link Kim, Young-Gon; 김영곤; et al, 한국과학기술원, 2000 |
| Test case generation using dependency information derived from architecture description = 아키텍쳐 기술로부터 도출한 의존성 정보를 이용한 테스트 케이스 생성link Huh, Yu-Jin; 허유진; et al, 한국과학기술원, 2002 |
| Test Case Prioritization Based on Information Retrieval Concepts JUNG-HYUN, KWON; Ko, In-Young; Gregg Rothermel; Matt Staats, Asia-Pacific Software Engineering Conference (APSEC), APSEC, 2014-12-02 |
| Test cases generation from UML activity diagrams Kim, Hyungchoul; Kang, Sungwon; Baik, Jongmoon; Ko, In-Young, SNPD 2007: 8th ACIS International Conference on Software Engineering, Artificial Intelligence, Networking, and Parallel/Distributed Computing, v.3, pp.556 - 561, SNPD, 2007-07-30 |
| Test cases generation from UML state diagrams Kim, Y.G.; Hong, H.S.; Bae, Doo-Hwan; Cha, Sungdeok, IEE PROCEEDINGS: SOFTWARE, v.146, no.4, pp.187 - 192, 1999-08 |
| Test Collection Construction for QA system using Ontology Instance Triplet Nam, Y; Choi, Key-Sun, 6th Internaltional Semantic Web Conference, 2007 |
| Test data regeneration: generating new test data from existing test data Yoo, Shin; Harman, M., SOFTWARE TESTING VERIFICATION & RELIABILITY, v.22, no.3, pp.171 - 201, 2012-05 |
| Test Generation for VMF Tactical Data Link Messages - Coping with Message Length Variability and Semantic Message Rules Lee, Jihyun; Kang, Sungwon; Ko, Kyungmin; Keum, Changsup; Kim, Myungchul; Lee, Danhyung, The IEEE 22nd International Symposium on Software Reliability Engineering (ISSRE 2011) , IEEE, 2011-11 |
| Test Sequence Generation for Adaptive Interoperability Testing Kang, Sungwon; Kim, Myungchul, IFIP TC6/WG6.1 The 8th International Workshop on Protocol Test Systems (IWPTS'95), pp.193 - 206, 1995-09 |
| Test sequence generation from modechart specification = Modechart 명세 기반의 실시간 시스템 테스트 시퀀스 생성link Lee, Nam-Hee; 이남희; et al, 한국과학기술원, 1998 |
| Test sequence generation from specification in system description language = 시스템 기술 언어로 된 규격으로 부터의 시험 계열 생성 기법link Chin, Byoung-Moon; 진병문; et al, 한국과학기술원, 1996 |
| Test Set Diameter: Quantifying the Diversity of Sets of Test Cases Feldt, Robert; Poulding, Simon; Clark, David; Yoo, Shin, 9th IEEE International Conference on Software Testing, Verification and Validation, ICST 2016, pp.223 - 233, Institute of Electrical and Electronics Engineers Inc., 2016-04-14 |
| Test-Time Self-Adaptive Small Language Models for Question Answering Jeong, Soyeong; Baek, Jinheon; Cho, Sukmin; Hwang, Sung Ju; Park, Jong-Cheol, The 2023 Conference on Empirical Methods in Natural Language Processing, Association for Computational Linguistics (ACL), 2023-12-07 |
| Testing Concurrent Programs to Achieve High Synchronization Coverage Hong, Shin; Ahn, Jaemin; Park, Sangmin; Kim, Moonzoo; Harrold, Mary-Jean, International Symposium on Software Testing and Analysis, ACM, 2012-07-18 |
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