Browse "School of Computing(전산학부)" by Author Papadakis, Mike
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| Are Mutation Scores Correlated with Real Fault Detection? A Large Scale Empirical study on the Relationship Between Mutants and Real Faults Papadakis, Mike; Shin, Donghwan; Yoo, Shin; Bae, Doo-Hwan, International Conference on Software Engineering, pp.537 - 548, IEEE Computer Society and ACM SIGSOFT, 2018-05-31 |
| Empirical evaluation of mutation-based test case prioritization techniques Shin, Donghwan; Yoo, Shin; Papadakis, Mike; Bae, Doo-Hwan, Software Testing, Verification and Reliability, v.29, no.1-2, pp.e1695, 2019-03 |
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