Browse "School of Computing(전산학부)" by Author An, Gabin
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| Ahead of Time Mutation Based Fault Localisation using Statistical Inference Kim, Jinhan; An, Gabin; Feldt, Robert; Yoo, Shin, 2021 IEEE 32nd International Symposium on Software Reliability Engineering, ISSRE 2021, pp.253 - 263, IEEE, 2021-10-28 |
| Assisting Bug Report Assignment Using Automated Fault Localisation: An Industrial Case Study Sohn, Jeongju; An, Gabin; Hong, Jingun; Hwang, Dongwon; Yoo, Shin, 14th IEEE Conference on Software Testing, Verification and Validation (ICST), pp.284 - 294, IEEE COMPUTER SOC, 2021-04-14 |
| Automatically Identifying Shared Root Causes of Test Breakages in SAP HANA An, Gabin; Yoon, Juyeon; Sohn, Jeongju; Hong, Jingun; Hwang, Dongwon; Yoo, Shin, 44th ACM/IEEE International Conference on Software Engineering: Software Engineering in Practice, ICSE-SEIP 2022, pp.65 - 74, IEEE Computer Society, 2022-05-25 |
| Comparing Line and AST Granularity Level for Program Repair using PyGGI An, Gabin; Kim, Jinhan; Yoo, Shin, ACM/IEEE 4th International Genetic Improvement Workshop (GI at ICSE), pp.19 - 26, International Workshop on Genetic Improvement, 2018-06-02 |
| FDG: a precise measurement of fault diagnosability gain of test cases An, Gabin; Yoo, Shin, 31st ACM SIGSOFT International Symposium on Software Testing and Analysis, ISSTA '22, pp.14 - 26, ACM, 2022-07-20 |
| Fonte: Finding Bug Inducing Commits from Failures An, Gabin; Yoo, Shin; Hong, Jingun; Kim, Naryeong, 45th International Conference on Software Engineering, IEEE/ACM, 2023-05-17 |
| Learning test-mutant relationship for accurate fault localisation Kim, Jinhan; An, Gabin; Feldt, Robert; Yoo, Shin, INFORMATION AND SOFTWARE TECHNOLOGY, v.162, 2023-10 |
| Localising software faults by learning patterns of failing executions = 실행 오류 패턴 학습을 통한 소프트웨어 결함 위치 식별 기술link An, Gabin; Yoo, Shin; et al, 한국과학기술원, 2020 |
| Reducing the search space of bug inducing commits using failure coverage An, Gabin; Yoo, Shin, European Software Engineering Conference and Symposium on the Foundations of Software Engineering (ESEC/FSE 2021), pp.1459 - 1462, ACM, 2021-08-25 |
| Searching for Multi-fault Programs in Defects4J An, Gabin; Yoon, Juyeon; Yoo, Shin, 13th International Symposium on Search Based Software Engineering, SSBSE 2021, pp.153 - 158, Springer International Publishing, 2021-10-11 |
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