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Effective and efficient test generation for multithreaded programs using concurrency coverage metrics = 동시성 커버리지 메트릭을 이용한 멀티쓰레드 프로그램의 효과적이고 효율적인 테스트 생성link Hong, Shin; 홍신; et al, 한국과학기술원, 2015 |
MAESTRO: Automated test generation framework for high test coverage and reduced human effort in automotive industry Kim, Yunho; Lee, Dongju; Baek, Junki; Kim, Moonzoo, INFORMATION AND SOFTWARE TECHNOLOGY, v.123, 2020-07 |
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