Fourier-transform analysis of electrostatic potential distribution through a thick slit
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, YS | ko |
| dc.contributor.author | Eom, Hyo Joon | ko |
| dc.date.accessioned | 2013-03-03T00:41:18Z | - |
| dc.date.available | 2013-03-03T00:41:18Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1996-02 | - |
| dc.identifier.citation | IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, v.38, no.1, pp.77 - 79 | - |
| dc.identifier.issn | 0018-9375 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/76296 | - |
| dc.description.abstract | A potential distribution through a slit in a thick conducting plane is examined. The Pourier-transform is used to represent the potential in the spectral domain and the boundary conditions are enforced to represent a solution in closed form. Our solution is in a rapidly converging series so that it is numerically efficient. The Fourier-transform approach is novel in that it allows us to obtain a simple series solution without recourse to the Schwarz-Christoffel transformation. | - |
| dc.language | English | - |
| dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
| dc.title | Fourier-transform analysis of electrostatic potential distribution through a thick slit | - |
| dc.type | Article | - |
| dc.identifier.wosid | A1996UA15400011 | - |
| dc.identifier.scopusid | 2-s2.0-0030085531 | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 38 | - |
| dc.citation.issue | 1 | - |
| dc.citation.beginningpage | 77 | - |
| dc.citation.endingpage | 79 | - |
| dc.citation.publicationname | IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY | - |
| dc.contributor.localauthor | Eom, Hyo Joon | - |
| dc.contributor.nonIdAuthor | Kim, YS | - |
| dc.type.journalArticle | Article | - |
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