Browse "College of Engineering(공과대학)" byTypeConference

Showing results 62161 to 62180 of 80817

62161
Three-Switch Active-Clamp Forward Converter with Low Switch Voltage Stress

Park, Ki-Bum; Kim, Chong-Eun; Moon, GunWooresearcher; Youn, Myung-Joong, Applied Power Electronics Conference and Exposition, 2009. APEC 2009. Twenty-Fourth Annual IEEE, pp.1390 - 1396, IEEE, 2009-02-15

62162
Three-Switch Active-Clamp Forward Converter with Low Voltage Stress

Park, Ki-Bum; Kim, Chong-Eun; Moon, Gun-Wooresearcher; Youn, MyungJoong, 2008년 전력전자학술대회, pp.505 - 507, KIPE, 2008-06-30

62163
Three-switch active-clamp forward converter with reduced voltage stress

Park, KB; Kim, CE; Moon, GW; Youn, Myung Joongresearcher, IEEE APEC, IEEE, 2010-04

62164
Three-switch LLC resonant converter for high efficiency adapter with universal input voltage

Lee, Jeong-Soo; Kim, Chong-Eun; Choi, Jae-Won; Baek, Jae-Il; Yeon, Cheol O; Moon, Gun-Wooresearcher, Future Energy Electronics Conference and ECCE Asia (IFEEC 2017 - ECCE Asia), 2017 IEEE 3rd International, IEEE, 2017-06-07

62165
Three-vortex layers around a circular cylinder close to the free surface

Yoo, Y; Cho, Yeun Wooresearcher, 2015 KAIST-Keio University Joint Workshop on Advanced Fluid Mechanics, KAIST, 2015-08-14

62166
Three-way junction structure-based isothermal amplification for DNA detection

Park, Hyun Gyuresearcher; Lee, Seoyoung; Jang, Hyowon, 2018 the 2nd International Conference on Materials Engineering and Nano Sciences, ICMENS, 2018-01-11

62167
Three-Way Junction Structure-Induced Exponential Signal Amplification to Detect Nucleic Acids

Lee, Seoyoung; Park, Hyun Gyuresearcher, 25th Symposium of YABEC, Asian Federation of Biotechnology, 2019-11-22

62168
Three−Dimensional Simulation of a Flapping Flag in a Uniform Flow

Huang, W.-X.; Sung Hyung Jinresearcher, Fluid and Elasticity 2009, 2009-06

62169
Threshold analysis of a sequential detection scheme with locally optimum test statistic

Choi, S.W.; Lee, J.; Kwon, H.; Park, S.R.; Song, Iickhoresearcher, Fall Confer. Inst. EEK, pp.217 - 220, 대한전자공학회, 2005-11

62170
Threshold based Channel Admission Control in IPTV System

Choi, JunKyunresearcher, ICOIN 2007, 2007

62171
Threshold Boolean Filters

Lee, Yong-Hoonresearcher; Lee, K.D., Proc. Canadiam Conf. on Electrical and Computer Eng., 1992-09

62172
threshold current density InGaAs surface-emitting lasers buried by amorphous GaAs

Park, HyoHoonresearcher; Yoo, BS; Lee, EH; Park, MS; Ahn, BT, International Conference on Solid State Devices and Material 1995s, pp.443 - 445, 1995-08-21

62173
Threshold Detection for Timing Recovery

Moon, Jaekyunresearcher, International Magnetics Conference, pp.0 - 0, 2000-04-12

62174
Threshold Password-based Authenticated Key Exchange using Matrix

Park, C; Lee, S; Yoon, Hyunsooresearcher, 3rd International Conference on Computing, Communications and Control Technologies (CCCT'05), pp.39 - 43, CCCT'05 (International Conference on Computing, Communications and Control Technologies), 2005-07-24

62175
Threshold Signature에 관한 연구

홍성민; 윤현수researcher, KIMICS(Korea Institute Maritime Information & Communication Science) Conference, pp.315 - 320, 한국해양정보통신학회, 1998

62176
Threshold Stress Intensity for Hydrogen-Assisted Intergranular Cracking

변수일, Korean Corros. Sci. Soc., pp.14 - 14, 1987

62177
Threshold Voltage Control in OTFT by Modifying the Composition of Copolymer Dielectrics

Pak, Kwanyong; Seong, Hyejeong; Choi, Junhwan; Hwang, Wan Sik; Im, Sung Gap, 2016 IMID, Inthernational Meeting on Information Display, 2016-08-25

62178
Threshold Voltage Model for Short Channel MOSFET's using the Step Profile Approximation

Sang-Won Kangresearcher, Proc. of 18th Annul Conf. on modeling and Simulation, pp.719 -, 1987

62179
Threshold Voltage Shift by Quantum Confinement in Ultra-thin Body Device

Choi, Yang-Kyuresearcher; Ha, Daewon; King, Tsu-Jae; Hu, Chenming, IEEE, pp.85 - 86, 2001-06

62180
Threshold Voltage Shift Due to the Change of Impurity Type of Polysilicon in Heavily Doped Polysilicon Gate MOSFET

Kim, Choong Ki, International Symposium on VLSI Technology,Systems and Applications, pp.170 - 173, 1983

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