Browse "College of Engineering(공과대학)" by Type Conference

Showing results 36421 to 36440 of 90910

36421
High-repetition rate, diode-pumped Yb:KYW lasers for precision manufacturing

Yang, H; Kim, C; Choi, SY; Kim, GH; Rotermund, F; Kim, Jung-Won, International Conference of Manufacturing Technology Engineers (ICMTE 2012), Korean Society of Manufacturing Technology Engineers, 2012-10-19

36422
High-Resolution and Low-cost Ag photomask Fabrication by Using Laser Direct Patterning Method

Yang, Min-Yang; Youn, Jin-Ho; Park, Jung-Hwan; Kang, Bong-Chul, ICMTE(International Conference of Manufacturing Technology Engineers) 2012, Seoul, Korea, 한국생산제조시스템학회, 2012-10

36423
High-resolution chromatic optical coherence tomography with extended imaging range

Lee, Seung Eon; Yoo, Hongki, SPIE Photonics West 2023, SPIE, 2023-01-30

36424
High-resolution fMRI at 7T using generalized series parallel imaging technique

Yun, Sungdae; Chung, Jun-Young; Oh, Sung Suk; Yoon, HyoWoon; Cho, Zang-Hee; Park, HyunWook, 14th Annual Meeting of the Organization for Human Brain Mapping v. no. , Organization of Human Brain Mapping, 2008-06

36425
High-resolution Hyperspectral Imaging via Matrix Factorization

Kawakami, Rei; Wright, John; Tai, Yu-Wing; Matsushita, Yasuyuki; Ben-Ezra, Moshe; Ikeuchi, Katsushi, 2011 IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2011, pp.2329 - 2336, IEEE Computer Society, 2011-06

36426
High-Resolution Image Dehazing with respect to Training Losses and Receptive Field Sizes

SIM, HYEONJUN; Ki, Sehwan; Choi, Jae Seok; Kim, Soo Ye; Seo, Soomin; Kim, Saehun; Kim, Munchurl, IEEE Computer Vision and Pattern Recognition Workshops (CVPRW), pp.1025 - 1032, IEEE Computer Society and the Computer Vision Foundation (CVF), 2018-06-18

36427
High-resolution liquid phase electron microscopy

Yuk, Jong Min, EAMC3 Satelite Meeting, Korea Society of Microscopy, 2017-11-10

36428
High-resolution microelectromechanical scanners for miniaturized dual-axes confocal microscopes

Ra, H.; Jung, I.W.; Lee, D.; Krishnamoorthy, U.; Yu, Kyoungsik; Solgaard, O., SPIE (Optical Transmission, Switching, and Subsystems) , v.5721, no.0, pp.132 - 135, SPIE, 2005-01

36429
High-resolution Multispectral Fluorescence Lifetime Imaging Microscopy for Characterization of Atherosclerosis Plaque

Han, Jeongmoo; Nam, Hyeong Soo; Lee, Min Woo; Kim, Sun Won; Song, Joon Woo; Kim, Jin Won; Yoo, Hongki, OSA Biophotonics Congress: Optics in the Life Sciences, OSA, 2019-04-15

36430
High-resolution Nanolithography via Supramolecular Self-assembly

Jung, Hee-Tae, Polyconsendation 2022, The Polymer Society of Korea, 2022-09-15

36431
High-Resolution Novel View Synthesis via Cross-Guided Optimization of Radiance Fields with Multi-View Image Super-Resolution

윤영호; 윤국진, 제35회 영상 처리 및 이해에 관한 워크샵(IPIU), 한국방송·미디어공학회, 2023-02-08

36432
High-Resolution Phased-Subarray MIMO Radar

한가원; 홍성철, 2022 전파 및 무선통신 학술대회, 한국전자파학회, 2022-10-28

36433
High-resolution reconstruction for no data gaps in narrow angle camera digital terrain models using Gaussian process-latent variable model

Park, Young-Jin; Moon, SungHyun; Choi, Han-Lim, Lunar and Planetary Science Conference 2018, Lunar and Planetary Institute, NASA, 2018-03-20

36434
High-resolution time-of-flight measurement using a femtosecond pulse laser

Lee, J; Kim, YJ; Lee, K; Lee, SH; Kim, Seung-Woo, the 10th International Symposium on Measurement Technology and Intelligent Instruments, International Symposium on Measurement Technology and Intelligent Instruments, 2011-06-29

36435
High-resolution time-of-flight measurement using a femtosecond pulse laser

Lee, J; Kim, YJ; Lee, K; Lee, SH; Kim, Seung-Woo, The 4th International Conference on Positioning Technology (ICPT), The 4th International Conference on Positioning Technology, 2010-11

36436
High-resolution Time-of-Flight Measurement using a Femtosecond Pulse Laser

Lee, J; KIM, Young-Jin; Lee, K; Lee, S; Kim, Seung-Woo, International Conference on Positioning Technology (ICPT), 2010, International Conference on Positioning Technology (ICPT), 2010-11

36437
High-Resolution Transmission Electron Microscopy of the Interfaces in Materials

Lee, Jeong Yong, 3rd Conf. on Materials and Material Properties-Principles and Applications of TEM and XRD, pp.5 - 5, 1989-10-01

36438
High-Resolution Virtual Try-On with Misalignment and Occlusion-Handled Conditions

Lee, Sangyun; Gu, Gyojung; Park, Sunghyun; Choi, Seunghwan; Choo, Jaegul, 17th European Conference on Computer Vision (ECCV), pp.204 - 219, SPRINGER INTERNATIONAL PUBLISHING AG, 2022-10

36439
High-resolution, high-speed microscanner in single-crystalline silicon actuated by self-aligned dual-mode vertical electrostatic combdrive with capability for phased array operation

Lee, D.; Krishnamoorthy, U.; Yu, Kyoungsik; Solgaard, O., Transducers (International Conference on Solid-State Sensors and Actuators) , pp.576 - 579, Transducers, 2003-06

36440
High-Resolution, High-Yield Patterning of Quantum Dots via Controlling Solvent-Surface Interactions

Nam, Tae Won; Kim, Moohyun; Song, Kyeongmin; Jung, Yeon Sik, International Meeting on Information Display, IMID 2021, KIDS, SID, 2021-08-27

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