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Charged Defect Quantification in Pt/Al2O3/In0.53Ga0.47As/InP MOS Capacitors Long, R. D.; Shin, B.; Monaghan, S.; Cherkaoui, K.; Cagnon, J.; Stemmer, S.; McIntyre, P. C., JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.158, no.5, pp.103 - 107, 2011 |
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