Browse "College of Engineering(공과대학)" by Author Kwon, Yonghwi

Showing results 11 to 20 of 20

11
Matrix-OPC with fast MEEF prediction using artificial neural network

Kwon, Yonghwi; Shin, Youngsoo, Conference on DTCO and Computational Patterning, SPIE, 2022-04-28

12
Multisource Clock Tree Synthesis Through Sink Clustering and Fast Clock Latency Prediction

Choi, Byungho; Kwon, Yonghwi; Afzaal, Umar; Shin, Youngsoo, 56th IEEE International Symposium on Circuits and Systems, ISCAS 2023, Institute of Electrical and Electronics Engineers Inc., 2023-05-22

13
Optical proximity correction using bidirectional recurrent neural network (BRNN)

Kwon, Yonghwi; Song, Youngsoo; Shin, Youngsoo, Conference on Design-Process-Technology Co-Optimization for Manufacturability XIII, SPIE, 2019-02-27

14
Optical Proximity Correction Using Bidirectional Recurrent Neural Network With Attention Mechanism

Kwon, Yonghwi; Shin, Youngsoo, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.34, no.2, pp.168 - 176, 2021-05

15
Optimization of accurate resist kernels through convolutional neural network

Kwon, Yonghwi; Shin, Youngsoo, Conference on Optical Microlithography XXXIV, SPIE, 2021-02-21

16
Pre-layout clock tree estimation and optimization using artificial neural network

Koh, Sunwha; Shin, Youngsoo; Kwon, Yonghwi, ACM/IEEE International Symposium on Low Power Electronics and Design, ISLPED 2020, pp.193 - 198, ACM, IEEE, 2020-08-10

17
Refragmentation through machine learning classifier for fast and accurate optical proximity correction

Cho, Gangmin; Kwon, Yonghwi; Taeyoung Kim; Shin, Youngsoo, Conference on DTCO and Computational Patterning, SPIE, 2022-04-28

18
SRAF printing prediction using artificial neural network

Kwon, Yonghwi; Yang, Jinho; Kim, Sungho; Kim, Cheolkyun; Shin, Youngsoo, Conference on Optical Microlithography XXXIII, SPIE, 2020-02-25

19
Test pattern extraction for lithography modeling under design rule revisions

Cho, Gangmin; Kwon, Yonghwi; Kareem, Pervaiz; Kim Sungho; Shin, Youngsoo, Conference on Optical Microlithography XXXIV, SPIE, 2021-02-21

20
Transient clock power estimation of pre-CTS netlist

Kwon, Yonghwi; Jung, Jinwook; Han, In-Hak; Shin, Youngsoo, IEEE International Symposium on Circuits & Systems, Institute of Electrical and Electronics Engineers, 2018-05-27

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