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NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
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Direct Measurement of Adhesion Energy of Monolayer Graphene As-Grown on Copper and Its Application to Renewable Transfer Process Yoon, Tae-Shik; Shin, Woo-Cheol; Kim, Taek-Yong; Mun, Jeong-Hun; Kim, Taek-Soo; Cho, Byung-Jin, NANO LETTERS, v.12, no.3, pp.1448 - 1452, 2012-03 | |
Penetration and lateral diffusion characteristics of polycrystalline graphene barriers Yoon, Tae-Shik; Mun, Jeong-Hun; Cho, Byung Jin; Kim, Taek-Soo, NANOSCALE, v.6, no.1, pp.151 - 156, 2014-01 |
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