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|NO||Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)|
|1||A calibrated atomic force microscope using an orthogonal scanner and a calibrated laser interferometer|
Lee, Dong-Yeon; Kim, Dong-Min; Gweon, Dae-Gabresearcher; Park, Jinwon, APPLIED SURFACE SCIENCE, v.253, no.8, pp.3945 - 3951, 2007-02
|2||An education model of a nano-positioning system for mechanical engineers|
Lee, Dong-Yeon; Gweon, Dae-Gabresearcher, JOURNAL OF MECHANICAL SCIENCE AND TECHNOLOGY, v.20, no.10, pp.1702 - 1715, 2006-10