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NO	Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
1	Rapid wavelength-swept spectrally encoded confocal microscopy Boudoux, C; Yun, SH; Oh, Wang-Yuhl; White, WM; Iftimia, NV; Shishkov, M; Bouma, BE; Tearney, GJ, OPTICS EXPRESS, v.13, no.20, pp.8214 - 8221, 2005-10
2	Application of laser joining process for elimination of stair steps in steel laminate tooling Yoon, SH; Na, Suck-Joo, INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, v.25, pp.154 - 159, 2005-01
3	Calibration method for rotating-analyser-type spectral imaging ellipsometers Chegal, W; Cho, YJ; Oh, SB; Cho, HM; Lee, YW; Kim, Soohyun, MEASUREMENT SCIENCE & TECHNOLOGY, v.16, pp.716 - 722, 2005-03

Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)

Boudoux, C; Yun, SH; Oh, Wang-Yuhl; White, WM; Iftimia, NV; Shishkov, M; Bouma, BE; Tearney, GJ, OPTICS EXPRESS, v.13, no.20, pp.8214 - 8221, 2005-10

Yoon, SH; Na, Suck-Joo, INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, v.25, pp.154 - 159, 2005-01

Chegal, W; Cho, YJ; Oh, SB; Cho, HM; Lee, YW; Kim, Soohyun, MEASUREMENT SCIENCE & TECHNOLOGY, v.16, pp.716 - 722, 2005-03

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