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NO	Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
1	High speed volumetric thickness profile measurement based on full-field wavelength scanning interferometer You, Jang-Woo; Kim, Soohyun; Kim, Daesuk, OPTICS EXPRESS, v.16, no.25, pp.21022 - 21031, 2008-12
2	Simultaneous measurement method of total and self-interference for the volumetric thickness-profilometer You, JW; Kim, D; Ryu, SY; Kim, Soohyun, OPTICS EXPRESS, v.17, no.3, pp.1352 - 1360, 2009-02
3	Direct spectral phase function calculation for dispersive interferometric thickness profilometry Kim, D; Kim, Soohyun, OPTICS EXPRESS, v.12, pp.5117 - 5124, 2004-10

Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)

You, Jang-Woo; Kim, Soohyun; Kim, Daesuk, OPTICS EXPRESS, v.16, no.25, pp.21022 - 21031, 2008-12

You, JW; Kim, D; Ryu, SY; Kim, Soohyun, OPTICS EXPRESS, v.17, no.3, pp.1352 - 1360, 2009-02

Kim, D; Kim, Soohyun, OPTICS EXPRESS, v.12, pp.5117 - 5124, 2004-10

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