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Results 1-10 of 20 (Search time: 0.014 seconds).

NO Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
1
First-principles study of the segregation of boron dopants near the interface between crystalline Si and amorphous SiO2

Oh, Young-Jun; Noh, Hyeon-Kyun; Chang, Kee-Joo, PHYSICA B-CONDENSED MATTER, v.407, no.15, pp.2989 - 2992, 2012-08

2
Electrical transport properties of nanoscale devices based on carbon nanotubes

Kang, Joon Goo; Kim, Yong-Hoon; Chang, Kee-Joo, CURRENT APPLIED PHYSICS, v.9, no.11, pp.S7 - S11, 2009-01

3
Molecular-dynamics simulations for the shock Hugoniot meltings of Cu, Pd and Pt

Jeong, JW; Chang, Kee-Joo, JOURNAL OF PHYSICS-CONDENSED MATTER, v.11, no.19, pp.3799 - 3806, 1999-05

4
Local vibrational modes of H-2 and H-2* complexes in crystalline Si

Kim, YS; Jin, YG; Jeong, JW; Chang, Kee-Joo, SEMICONDUCTOR SCIENCE AND TECHNOLOGY, v.14, no.12, pp.1042 - 1047, 1999-12

5
First-principles calculation of the Coulomb pseudopotential mu* for the simple hexagonal phase of Si

Jin, YG; Lee, KH; Chang, Kee-Joo, JOURNAL OF PHYSICS-CONDENSED MATTER, v.9, no.30, pp.6351 - 6358, 1997-07

6
Invariant-molecular-dynamics study of the diamond-to-beta-Sn transition in Si under hydrostatic and uniaxial compressions

Lee, IH; Jeong, JW; Chang, Kee-Joo, PHYSICAL REVIEW B, v.55, no.9, pp.5689 - 5693, 1997-03

7
Ab initio study of boron segregation and deactivation at Si/SiO2 interface

Oh, Young-Jun; Hwang, Jin-Heui; Noh, Hyeon-Kyun; Bang, Jun-Hyeok; Ryu, Byung-Ki; Chang, Kee-Joo, MICROELECTRONIC ENGINEERING, v.89, pp.120 - 123, 2012-01

8
Retardation of boron diffusion in SiGe alloy

Bang, Junhyeok; Kim, Hanchul; Kang, Joongoo; Lee, Woo-Jin; Chang, Kee-Joo, PHYSICA B-CONDENSED MATTER, v.401, pp.196 - 199, 2007-12

9
Reliability issues and role of defects in high-k dielectric HfO2 devices

Kang, JG; Kim, DY; Chang, Kee-Joo, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.50, pp.552 - 557, 2007-03

10
Mechanism for the enhanced diffusion of charged oxygen ions in SiO2

Jin, YG; Chang, Kee-Joo, PHYSICAL REVIEW LETTERS, v.86, no.9, pp.1793 - 1796, 2001-02

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