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NO	Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
1	Semi-Supervised Multi-Label Learning for Classification of Wafer Bin Maps With Mixed-Type Defect Patterns Lee, Hyuck; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.33, no.4, pp.653 - 662, 2020-11
2	Memory-Augmented Convolutional Neural Networks With Triplet Loss for Imbalanced Wafer Defect Pattern Classification Hyun, Yunseung; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.33, no.4, pp.622 - 634, 2020-11
3	Fault Classification in High-Dimensional Complex Processes Using Semi-Supervised Deep Convolutional Generative Models Ko, Taeyoung; Kim, Heeyoung, IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS, v.16, no.4, pp.2868 - 2877, 2020-04

Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)

Lee, Hyuck; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.33, no.4, pp.653 - 662, 2020-11

Hyun, Yunseung; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.33, no.4, pp.622 - 634, 2020-11

Ko, Taeyoung; Kim, Heeyoung, IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS, v.16, no.4, pp.2868 - 2877, 2020-04

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