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Results 1-10 of 12 (Search time: 0.008 seconds).

NO Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
1
A Multiscale Spatially Varying Coefficient Model for Regional Analysis of Topsoil Geochemistry

Kim, Keunseo; Kim, Hyojoong; Kim, Vinnam; Kim, Heeyoungresearcher, JOURNAL OF AGRICULTURAL BIOLOGICAL AND ENVIRONMENTAL STATISTICS, v.25, no.1, pp.74 - 89, 2020-03

2
Multiresolution spatial generalized linear mixed model for integrating multi-fidelity spatial count data without common identifiers between data sources

Kim, Sungil; Duan, Rong; Ma, Guang-Qin; Kim, Heeyoungresearcher, SPATIAL STATISTICS, v.39, 2020-10

3
Semi-Supervised Multi-Label Learning for Classification of Wafer Bin Maps With Mixed-Type Defect Patterns

Lee, Hyuck; Kim, Heeyoungresearcher, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.33, no.4, pp.653 - 662, 2020-11

4
Memory-Augmented Convolutional Neural Networks With Triplet Loss for Imbalanced Wafer Defect Pattern Classification

Hyun, Yunseung; Kim, Heeyoungresearcher, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.33, no.4, pp.622 - 634, 2020-11

5
Bayesian Nonparametric Joint Mixture Model for Clustering Spatially Correlated Time Series

Lee, Youngmin; Kim, Heeyoungresearcher, TECHNOMETRICS, v.62, no.3, pp.313 - 329, 2020-07

6
Variational Deep Clustering of Wafer Map Patterns

Hwang, Jonghyun; Kim, Heeyoungresearcher, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.33, no.3, pp.466 - 475, 2020-08

7
Bayesian nonparametric latent class model for longitudinal data

Koo, Wonmo; Kim, Heeyoungresearcher, STATISTICAL METHODS IN MEDICAL RESEARCH, v.29, no.11, pp.3381 - 3395, 2020-11

8
Bayesian variable selection in clustering high-dimensional data via a mixture of finite mixtures

Doo, Woojin; Kim, Heeyoungresearcher, JOURNAL OF STATISTICAL COMPUTATION AND SIMULATION, v.91, no.12, pp.2551 - 2568, 2021-08

9
A Bayesian nonparametric mixture measurement error model with application to spatial density estimation using mobile positioning data with multi-accuracy and multi-coverage

Lee, Youngmin; Jeong, Taewon; Kim, Heeyoungresearcher, TECHNOMETRICS, v.62, no.2, pp.173 - 183, 2020-04

10
Fault Classification in High-Dimensional Complex Processes Using Semi-Supervised Deep Convolutional Generative Models

Ko, Taeyoung; Kim, Heeyoungresearcher, IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS, v.16, no.4, pp.2868 - 2877, 2020-04

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