Results 21-30 of 208 (Search time: 0.007 seconds).
NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
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Semi-Supervised Multi-Label Learning for Classification of Wafer Bin Maps With Mixed-Type Defect Patterns Lee, Hyuck; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.33, no.4, pp.653 - 662, 2020-11 | |
Memory-Augmented Convolutional Neural Networks With Triplet Loss for Imbalanced Wafer Defect Pattern Classification Hyun, Yunseung; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.33, no.4, pp.622 - 634, 2020-11 | |
Housing Market Agent-Based Simulation with Loan-To-Value and Debt-To-Income Yun, Tae-Sub; Moon, Il-Chul, JASSS-THE JOURNAL OF ARTIFICIAL SOCIETIES AND SOCIAL SIMULATION, v.23, no.4, 2020-10 | |
Effects of working posture, lifting load, and standing surface on postural instability during simulated lifting tasks in construction Guo, Liangjie; Xiong, Shuping, ERGONOMICS, v.63, no.12, pp.1571 - 1583, 2020-12 | |
Design and Implementation of a Big Data Evaluator Recommendation System Using Deep Learning Methodology Cha, Sukil; Yi, Mun Y.; Youm, Sekyoung, APPLIED SCIENCES-BASEL, v.10, no.22, 2020-11 | |
Learning to utilize auxiliary reviews for recommendation Hyun, Dongmin; Park, Chanyoung; Cho, Junsu; Yu, Hwanjo, INFORMATION SCIENCES, v.545, pp.595 - 607, 2021-02 | |
Contextual Bayesian optimization with trust region (CBOTR) and its application to cooperative wind farm control in region 2 Park, Jinkyoo, Sustainable Energy Technologies and Assessments, v.38, 2020-04 | |
Static replication of barrier-type options via integral equations Kim, Kyoung-Kuk; Lim, Dong-Young, QUANTITATIVE FINANCE, v.21, no.2, pp.281 - 294, 2021-02 | |
Wind Field-Based Short-Term Turbine Response Forecasting by Stacked Dilated Convolutional LSTMs Woo, Seongcheol; Park, Junyoung; Park, Jinkyoo; Manuel, Lance, IEEE Transactions on Sustainable Energy, v.11, no.4, pp.2294 - 2304, 2020-10 | |
Bayesian Nonparametric Joint Mixture Model for Clustering Spatially Correlated Time Series Lee, Youngmin; Kim, Heeyoung, TECHNOMETRICS, v.62, no.3, pp.313 - 329, 2020-07 |
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