Grain-Size Dependence of Electrically Induced Microcracking In Ferroelectric Ceramics
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | H.T. Chung | ko |
| dc.contributor.author | B.C. Shin | ko |
| dc.contributor.author | Kim, Ho Gi | ko |
| dc.date.accessioned | 2013-02-25T07:25:34Z | - |
| dc.date.available | 2013-02-25T07:25:34Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1989-02 | - |
| dc.identifier.citation | JOURNAL OF THE AMERICAN CERAMIC SOCIETY, v.72, no.2, pp.327 - 329 | - |
| dc.identifier.issn | 0002-7820 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/60541 | - |
| dc.language | English | - |
| dc.publisher | Wiley-Blackwell | - |
| dc.title | Grain-Size Dependence of Electrically Induced Microcracking In Ferroelectric Ceramics | - |
| dc.type | Article | - |
| dc.identifier.wosid | A1989T243400029 | - |
| dc.identifier.scopusid | 2-s2.0-0024611998 | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 72 | - |
| dc.citation.issue | 2 | - |
| dc.citation.beginningpage | 327 | - |
| dc.citation.endingpage | 329 | - |
| dc.citation.publicationname | JOURNAL OF THE AMERICAN CERAMIC SOCIETY | - |
| dc.contributor.localauthor | Kim, Ho Gi | - |
| dc.contributor.nonIdAuthor | H.T. Chung | - |
| dc.contributor.nonIdAuthor | B.C. Shin | - |
| dc.type.journalArticle | Note | - |
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