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Direct Assessment of Auger Recombination Rates of Charged Excitons via Opto-Electrical Measurements Lee, Hak June; Rhee, Seunghyun; Jung, Dongju; Park, Jeong Woo; Shin, Doyoon; Lim, Jaemin; Im, Seongbin; et al, ACS PHOTONICS, v.10, no.5, pp.1638 - 1648, 2023-05 |
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