Effects of Annealing Temperature on Microstructure and Electrical and Optical Properties of Radio-Frequency-Sputtered Tin-Doped Indium Oxide Films

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Publisher
Wiley-Blackwell
Issue Date
1989-04
Language
English
Article Type
Article
Citation

JOURNAL OF THE AMERICAN CERAMIC SOCIETY, v.72, no.4, pp.698 - 701

ISSN
0002-7820
URI
http://hdl.handle.net/10203/58292
Appears in Collection
MS-Journal Papers(저널논문)
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