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Space-resolving flat-field extreme ultraviolet spectrograph system and its aberration analysis with wave-front aberration Choi, IW; Lee, JU; Nam, Chang Hee, APPLIED OPTICS, v.36, no.7, pp.1457 - 1466, 1997-03 |
Third-order aberration correction by using an iterative process and its application to a Petzval lens with an external entrance pupil Choi, J; Kim, TH; Kong, Hong-Jin; Lee, JU, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.47, pp.631 - 635, 2005-10 |
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