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Charge-transition levels of oxygen vacancy as the origin of device instability in HfO2 gate stacks through quasiparticle energy calculations Choi, Eun-Ae; Chang, Kee-Joo, APPLIED PHYSICS LETTERS, v.94, no.12, pp.122901 - 122901, 2009-03 |
Fabrication of oxidation-free contacts to nanopatterned Permalloy structures Kim, Hye-Young; Lee, Kang Ho; Kim, Gyu-Tae; Kang, Woun; Lee, Kyung-Jin, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, v.27, no.6, pp.2487 - 2489, 2009-11 |
UV photovoltaic cells based on conjugated ZnO quantum dot/multiwalled carbon nanotube heterostructures Li, Fushan; Cho, Sung Hwan; Son, Dong Ick; Kim, Tae Whan; Lee, Sun-Kyun; Cho, Yong-Hoon; Jin, Sungho, APPLIED PHYSICS LETTERS, v.94, no.11, 2009-03 |
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