마스크 없는 Pendeo epitaxy 공정에 의한 저결함 GaN 박막의 미세구조 연구Microstructural characterization of the low dislocation density GaN films grown by maskless pendeo epitaxy

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Advisors
이정용researcherLee, Jeong-Yongresearcher
Description
한국과학기술원 : 신소재공학과,
Publisher
한국과학기술원
Issue Date
2004
Identifier
238318/325007  / 020023220
Language
kor
Description

학위논문(석사) - 한국과학기술원 : 신소재공학과, 2004.2, [ iv, 100 p. ]

Keywords

GAN; GaN; EPITAXY; 박막

URI
http://hdl.handle.net/10203/51604
Link
http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=238318&flag=dissertation
Appears in Collection
MS-Theses_Master(석사논문)
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