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NO Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
1
고집적 DRO FRAM 소자용 PZT 박막 캐패시터의 신뢰성 연구 = Reliability study in PZT thin film capacitors for high-density DRO FRAM deviceslink

이강운; Lee, Kang-Woon; 이원종; Lee, Won-Jong, 한국과학기술원, 2003

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