학위논문(박사) - 한국과학기술원 : 원자력공학과, 1998.2, [ ix, 108 p. ]
Combinational circuits; ATG; Automatic test pattern generation; Stuck-at faults; 조합논리회로; 동적고장; 정적고장; 자동검사입력단; Delay faults
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