Automatic test pattern generation for stuck-at and delay faults in combinational circuits = 조합논리회로의 정적 및 동적고장에 대한 자동검사입력단 생성에 관한 연구

Cited 0 time in webofscience Cited 0 time in scopus
  • Hit : 367
  • Download : 0
The present studies are developed to propose the automatic test pattern generation (ATG) algorithms for combinational circuits. These ATG algorithms are realized in two ATG programs: One is the ATG program for stuck-at fault and the other one for delay faults. In order to accelerate the ATG process, these two ATG programs have a common feature (the search method based on the concept of the degree of freedom), whereas only ATG program for the delay fault utilizes the 19-valued logic, a type of composite valued logic. This difference between two ATG programs results from the difference of the target fault. Accelerating the ATG process is indispensable for improving the ATG algorithms. This acceleration is mainly achieved by reducing the number of the unnecessary backtrackings, making the earlier detection of the conflicts, and shortening the computation time between the implication. Because of this purpose, the developed ATG programs include the new search method based on the concept of the degree of freedom (DF). The DF concept, computed directly and easily from the system descriptions such as types of gates and their interconnections, is the criterion to decide which, among several alternate lines`` logic values required along each path, promises to be the most effective in order to accelerate and improve the ATG process. This DF concept is utilized to develop and improve both of ATG programs for stuck-at and delay faults in combinational circuits. In addition to improving the ATG process, reducing number of test pattern is indispensable for testing the delay faults because the size of the delay faults grows rapidly as increasing the size of the circuit. In order to improve the compactness of the test set, 19-valued logic are derived. Unlike other TG logic systems, 19-valued logic is utilized to generate the robustly hazard-free test pattern. This is achieved by using the basic 5-valued logic, proposed in this work, where the transition with no hazard is defi...
Advisors
Seong, Poong-Hyunresearcher성풍현researcher
Description
한국과학기술원 : 원자력공학과,
Publisher
한국과학기술원
Issue Date
1998
Identifier
133584/325007 / 000935031
Language
eng
Description

학위논문(박사) - 한국과학기술원 : 원자력공학과, 1998.2, [ ix, 108 p. ]

Keywords

Combinational circuits; ATG; Automatic test pattern generation; Stuck-at faults; 조합논리회로; 동적고장; 정적고장; 자동검사입력단; Delay faults

URI
http://hdl.handle.net/10203/48880
Link
http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=133584&flag=dissertation
Appears in Collection
NE-Theses_Ph.D.(박사논문)
Files in This Item
There are no files associated with this item.

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0