표면 감쇠파를 결합한 미소 공진구의 품위값 측정Direct measurement of microsphere cavity quality factors via evanescent-wave coupling

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dc.contributor.advisor안경원-
dc.contributor.advisorAn, Kyung-Won-
dc.contributor.author김선경-
dc.contributor.authorKim, Sun-Kyung-
dc.date.accessioned2011-12-14T07:56:36Z-
dc.date.available2011-12-14T07:56:36Z-
dc.date.issued2002-
dc.identifier.urihttp://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=173517&flag=dissertation-
dc.identifier.urihttp://hdl.handle.net/10203/48581-
dc.description학위논문(석사) - 한국과학기술원 : 물리학과, 2002.2, [ [iii], 45 p. ]-
dc.languagekor-
dc.publisher한국과학기술원-
dc.subject미소 공진구-
dc.subject품위값-
dc.subject표면 감쇠파-
dc.subjectcavity-
dc.subject결합-
dc.subjectmicrosphere-
dc.subjectquality factor-
dc.subjectevanescent field-
dc.subjectcoupling-
dc.subject공진기-
dc.title표면 감쇠파를 결합한 미소 공진구의 품위값 측정-
dc.title.alternativeDirect measurement of microsphere cavity quality factors via evanescent-wave coupling-
dc.typeThesis(Master)-
dc.identifier.CNRN173517/325007-
dc.description.department한국과학기술원 : 물리학과, -
dc.identifier.uid020003082-
dc.contributor.localauthor김선경-
dc.contributor.localauthorKim, Sun-Kyung-
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PH-Theses_Master(석사논문)
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