고배율 현미경 비젼 시스템을 이용한 길이측정에서의 에지검출 및 보정Edge detection and calibration of high magnification optical microscope vision systems for coordinate metrology
- Advisors
- 김승우researcher; Kim, Seung-Wooresearcher
- Description
- 한국과학기술원 : 기계공학과,
- Publisher
- 한국과학기술원
- Issue Date
- 1996
- Identifier
- 105418/325007 / 000943192
- Language
- kor
- Description
학위논문(석사) - 한국과학기술원 : 기계공학과, 1996.2, [ v, 51 p. ]
- Keywords
가간섭성; 에지검출; 초점위치오차; Defocus; Coherence; Edge detection
- Appears in Collection
- ME-Theses_Master(석사논문)
- Files in This Item
- There are no files associated with this item.
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