고배율 현미경 비젼 시스템을 이용한 길이측정에서의 에지검출 및 보정 = Edge detection and calibration of high magnification optical microscope vision systems for coordinate metrology

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Advisors
김승우researcherKim, Seung-Wooresearcher
Description
한국과학기술원 : 기계공학과,
Publisher
한국과학기술원
Issue Date
1996
Identifier
105418/325007 / 000943192
Language
kor
Description

학위논문(석사) - 한국과학기술원 : 기계공학과, 1996.2, [ v, 51 p. ]

Keywords

가간섭성; 에지검출; 초점위치오차; Defocus; Coherence; Edge detection

URI
http://hdl.handle.net/10203/46519
Link
http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=105418&flag=dissertation
Appears in Collection
ME-Theses_Master(석사논문)
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