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Results 11-17 of 17 (Search time: 0.003 seconds).

NO Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
11
An adaptive on-chip ESR controller scheme in power distribution network for simultaneous switching noise reduction

Shim, Jongjoo; Shin, Minchul; Kim, Hyungsoo; Kim, Joungho, IEEE Conference on Electrical Performance of Electronic Packaging, pp.169 - 172, IEEE, 2008-11-18

12
Analysis of Via Distribution Effect on Multi-layered Power/Ground Transfer Impedance of High-performance Packages

Kim, Joungho; Kim, Hyungsoo; Kim, Jingook; Jeong, Youchul; Park, Jongbae, IEEE 11th Topical Meeting on Electrical Performance of Electronic Packaging, pp.171 - 174, IEEE, 2002-10

13
An Efficient Hybrid Transmission Line Method (HTLM) for Analysis of Perforated Package Power/Ground Plane

Kim, Joungho; Jeong, Youchul; Kim, Hyungsoo; Kim, Jingook; Park, Jongbae, IEEE 11th Topical Meeting on Electrical Performance of Electronic Packaging, pp.179 - 183, IEEE, 2002-10

14
Analysis of noise isolation methods on split power/ground plane of multi-layered package and PCB for low jitter mixed mode system

Jeong, Youchul; Kim, Hyungsoo; Kim, Jingook; Park, Jongbae; Kim, Joungho, IEEE 12th Topical Meeting on Electrical Performance of Electronic Packaging, pp.199 - 202, IEEE, 2003-10-27

15
Prediction and Verification of Power/Ground Plane Edge Radiation Excited by Through-Hole Signal Via Based on Balanced TLM and Via Coupling Model

Pak, Jun So; Lee, Junwoo; Kim, Hyungsoo; Kim, Joungho, IEEE 12th Topical Meeting on Electrical Performance of Electronic Packaging, pp.181 - 184, IEEE, 2003-10-27

16
Significant Reduction of Power/Ground Inductive Impedance and Simultaneous Switching Noise by Using Embedded Film Capacitor

Kim, Hyungsoo; Jeong, Youchul; Park, Jongbae; Lee, SeokKyu; Hong, JongKuk; Hong, Youngsoo; Kim, Joungho, IEEE 12th Topical Meeting on Electrical Performance of Electronic Packaging, pp.129 - 132, IEEE, 2003-10-27

17
Accurate Measurement of Power/Ground Impedance with Embedded Film Capacitor using Two-port Self-Impedance Measurement Technique

Kim, Hyungsoo; Jeong, Youchul; Park, Joungbae; Lee, SeokKyu; Hong, JongKuk; Hong, Youngsoo; Kim, Joungho, IEEE 5th Electronics Packaging Technology Conference, pp.51 - 54, IEEE, 2003-12-10

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