Identification of primary aberrations on a lateral-shearing interferogram using neural network = 신경망학습을 이용한 전단 간섭계에서의 수차측정

Cited 0 time in webofscience Cited 0 time in scopus
  • Hit : 311
  • Download : 0
A method is proposed for the identification of the primary aberrations with a single image of lateral-shear interferogram, obtained from a monochromatic laser source, using neural network. Neural network is used to teach the features of the some sampled interferograms and identify the primary aberrations of all the other interferograms by the nature of its excellence of interpolation and extrapolation. To increase the sensitivity of the fringe variation by primary aberrations, large amount of shear is given. Analysis of the pattern is performed to find proper features to teach the neural network with reduced time. Simulations are performed to verify the suggested method.
Advisors
Oh, Jun-Horesearcher오준호researcher
Description
한국과학기술원 : 기계공학전공,
Publisher
한국과학기술원
Issue Date
2001
Identifier
165739/325007 / 000935212
Language
eng
Description

학위논문(박사) - 한국과학기술원 : 기계공학전공, 2001.2, [ xii, 111 p. ]

Keywords

Inference; Aberration; Lateral-shearing interferogram; Neural network; 신경망; 추론; 수차; 전단간섭계

URI
http://hdl.handle.net/10203/43055
Link
http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=165739&flag=dissertation
Appears in Collection
ME-Theses_Ph.D.(박사논문)
Files in This Item
There are no files associated with this item.

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0