(An) automatic transistor testing system using microcomputer system 85

Abstract

An automatic transistor testing system using microcomputer system 85 is designed and implemented to execute several parameters of transistor-current gain, breakdown voltage, and leakage current. This system consists of hardwired transistor testing system and MCS85, 8 bit word microcomputer with key board and teletypewriter. And the computer system will generate clocks of programmed length for system timing pulse. The hardwired transistor testing system consists of two programmable voltage sources and two programmable current sources, the switching parts and measurement circuitry. Hardwired system measures current gain, breakdown voltage, and leakage current. The computer system compares this data with given comparison limit and decided either Go or No Go. The system speed is 7,000 per hour including one handler. There is a growing tendency that the Automatic System instead of the conventional labor-forced system is developed for mass production and high quality.