Large-signal modeling of InP/InGaAs single heterojunction bipolar transistors including thermal and impact ionization effects = 열효과와 Impact ionization 효과를 포함한 InP/InGaAs 단일 이종접합 바이폴라 트랜지스터 대신호 모델링

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In this thesis, modeling of InP/InGaAs single heterojunction bipolar transistors (SHBTs) has been presented. Also, the thermal characteristics of InP/InGaAs SHBTs have been discussed. The small-signal model parameters of InP/InGaAs SHBTs were extracted and optimized at various bias operating conditions such as the cut-off, open-collector and active mode. To verify the small-signal model, the multi-bias S-parameter measurements under active mode bias conditions were performed, and the good agreement between the measured and modeled data was obtained at various bias conditions. The thermal characteristics of InP/InGaAs SHBTs have been analyzed and discussed on the theoretical and experimental results. In order to investigate the contribution of impact ionization and built-in potential reduction effects to thermal behavior of the devices, the thermal related parameters, such as temperature dependence of impact ionization multiplication factor, thermal-electric feedback coefficient and thermal resistance, were extracted. Using these extracted parameters, the built-in potential reduction and impact ionization effects in the common-emitter I-V characteristics of InP/InGaAs SHBTs have been analyzed. Based on the results obtained in thermal characteristics of InP SHBTs, a new large-signal model of InP/InGaAs SHBTs has been developed which includes self-heating and impact ionization effects. The self-heating and impact ionization effects observed from the InP-based SHBTs have been modeled through a macro modeling approach. The dependence of impact ionization on VCB and junction temperature has been modeled using a feedback current source and a temperature dependent voltage source. The model implemented in HP-ADS has been verified by comparing the measured and simulated data. Good agreement between the measured and simulated data has been achieved in the overall device performance of dc, multi-bias small-signal S-parameter and large-signal microwave p...
Advisors
Yang, Kyoung-Hoonresearcher양경훈researcher
Description
한국과학기술원 : 전기및전자공학전공,
Publisher
한국과학기술원
Issue Date
2002
Identifier
174049/325007 / 020003145
Language
eng
Description

학위논문(석사) - 한국과학기술원 : 전기및전자공학전공, 2002.2, [ x, 100 p. ]

Keywords

Impact ionization; InP; heterojunction bipolar transistor; large-signal model; Thermal Effect; Thermal Effect; Impact Ionization; InP; 이종접합트랜지스터; 대신호 모델

URI
http://hdl.handle.net/10203/37519
Link
http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=174049&flag=dissertation
Appears in Collection
EE-Theses_Master(석사논문)
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