DC Field | Value | Language |
---|---|---|
dc.contributor.author | Yang, Daewon | ko |
dc.contributor.author | Park, Jinsu | ko |
dc.contributor.author | Park, Hayang | ko |
dc.contributor.author | Hong, Sungki | ko |
dc.contributor.author | Kim, Jongmin | ko |
dc.contributor.author | Huh, Seonghui | ko |
dc.contributor.author | Kim, Eunkyung | ko |
dc.contributor.author | Jeong, Jaeyong | ko |
dc.contributor.author | Chung, Yeonseung | ko |
dc.date.accessioned | 2024-09-06T06:00:09Z | - |
dc.date.available | 2024-09-06T06:00:09Z | - |
dc.date.created | 2023-09-19 | - |
dc.date.issued | 2024-07 | - |
dc.identifier.citation | QUALITY ENGINEERING, v.36, no.3, pp.510 - 520 | - |
dc.identifier.issn | 0898-2112 | - |
dc.identifier.uri | http://hdl.handle.net/10203/322780 | - |
dc.description.abstract | In this research, we analyze the real data in the NAND Flash memory industry using a control chart. There are thousands of electrical measures for each NAND Flash memory chip. We monitor these data through a control chart to ensure that the manufacturing process is in control. For better interpretability, we apply a univariate control chart technique to each variable. However, most existing control charts, such as the EWMA chart, do not include between-subgroup variations but only within-subgroup variations. They often obtain too narrow control limits for some variables, which leads too many subgroups to fall outside the control limits. To overcome this issue, we apply a control chart under a mixed-effects modeling framework to include both within-subgroup and between-subgroup variations. Additionally, the EWMA chart assumes that all the items are normally distributed; however, we frequently encounter that a normal assumption is violated. To overcome this limitation, we apply a robust approach based on a nonparametric sign chart. Furthermore, we introduce a p-value combination method to increase the statistical power for the gradual change detection of a statistical process. Our study show that the proposed control chart can efficiently monitor the real data in the NAND Flash memory industry. | - |
dc.language | English | - |
dc.publisher | TAYLOR & FRANCIS INC | - |
dc.title | Robust control chart based on mixed-effects modeling framework: A case study in NAND flash memory industry | - |
dc.type | Article | - |
dc.identifier.wosid | 001061422400001 | - |
dc.identifier.scopusid | 2-s2.0-85170521979 | - |
dc.type.rims | ART | - |
dc.citation.volume | 36 | - |
dc.citation.issue | 3 | - |
dc.citation.beginningpage | 510 | - |
dc.citation.endingpage | 520 | - |
dc.citation.publicationname | QUALITY ENGINEERING | - |
dc.identifier.doi | 10.1080/08982112.2023.2251570 | - |
dc.contributor.localauthor | Chung, Yeonseung | - |
dc.contributor.nonIdAuthor | Yang, Daewon | - |
dc.contributor.nonIdAuthor | Park, Jinsu | - |
dc.contributor.nonIdAuthor | Park, Hayang | - |
dc.contributor.nonIdAuthor | Hong, Sungki | - |
dc.contributor.nonIdAuthor | Kim, Jongmin | - |
dc.contributor.nonIdAuthor | Huh, Seonghui | - |
dc.contributor.nonIdAuthor | Kim, Eunkyung | - |
dc.contributor.nonIdAuthor | Jeong, Jaeyong | - |
dc.description.isOpenAccess | N | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordAuthor | mixed-effects model | - |
dc.subject.keywordAuthor | sign chart | - |
dc.subject.keywordAuthor | meta-analysis | - |
dc.subject.keywordAuthor | Stouffer&apos | - |
dc.subject.keywordAuthor | s method | - |
dc.subject.keywordAuthor | Statistical process control | - |
dc.subject.keywordAuthor | control chart | - |
dc.subject.keywordAuthor | high-dimensional data | - |
dc.subject.keywordPlus | (X)OVER-BAR | - |
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